1.

Conference Proceedings
Conference Proceedings
1. Atomic force microscopy using small cantilevers
Walters,D.A. ; Viani,M. ; Paloczi,G.T. ; Schaffer,T.E. ; Cleveland,J.P. ; Wendman,M.A. ; Gurley,G. ; Elings,V. ; Hansma,P.K.
Pub. info.: Micromachining and Imaging.  pp.43-47,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3009
2.

Conference Proceedings
Conference Proceedings
2. Atomic force microscope for small cantilevers
Schaffer,T.E. ; Viani,M. ; Walters,D.A. ; Drake,B. ; Runge,E.K. ; Cleveland,J.P. ; Wendman,M.A. ; Hansma,P.K.
Pub. info.: Micromachining and Imaging.  pp.48-52,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3009
3.

Conference Proceedings
Conference Proceedings
3. Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes
Taylor,R.S. ; Leopold,K.E. ; Wendman,M.A. ; Gurley,G. ; Elings,V.
Pub. info.: Micromachining and Imaging.  pp.119-129,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3009