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21 results

Conference Proceedings

1. Boundary artefact reduction using odd tile length and the low pass first convention

Wei,J. ; Pickering,M.R. ; Frater,M.R. ; Arnold,J.F. ; Boman,J.A. ; Zeng,W.

Pub. info.:	Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA. pp.282-289, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4472

Conference Proceedings

2. Economic model for QoS guarantee on the Internet

Zhang,C. ; Wei,J.

Pub. info.:	Data mining and applications : 23-24 October 2001, Wuhan, China. pp.116-121, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4556

Conference Proceedings

3. Illumination-invariant video segmentation by hierarchical robust thresholding

Wei,J. ; Drew,M.S. ; Li,Z.-N.

Pub. info.:	Storage and retrieval for image and video databases VI : 28-30 January 1998, San Jose, California. pp.188-201, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3312

Conference Proceedings

4. Damage mechanisms for KTiOPO4 crystals under irradiation of a cw argon laser

Mu,X. ; Ding,Y.J. ; Wang,J. ; Liu,Y. ; Wei,J. ; Khurgin,J.B.

Pub. info.:	Laser material crystal growth and nonlinear materials and devices : 27-28 January 1999, San Jose, California. pp.9-14, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3610

Conference Proceedings

5. Laser ablation and microstructuring of Si-containing polycarbonates and polyestercarbonates

Wei,J. ; Stebani,J. ; Kunz,T. ; Hahn,C. ; Lippert,T. ; Wokaun,A.J.

Pub. info.:	Computer-controlled microshaping : 16-18 June 1999, Munich, Germany. pp.146-154, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3822

Conference Proceedings

6. Nanocomposite multilayer optically variable coatings

Lu,J. ; Lai,Z. ; Wei,J. ; Zhang,H. ; Deng,Z. ; Zhang,Q. ; Wang,J.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.835-838, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

7. Application of sol-gel thin films on the transparent hologram

Deng,Z. ; Ni,X. ; Wang,J. ; Shen,J. ; Wei,J. ; Chen,L.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.757-760, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

8. Measurements of scintillation characteristics of PbWO4 crystals

Deng,J.K. ; Shang,R.C. ; Ning,C. G. ; Zhu,S. J. ; Pi,H. F. ; Zhu,W. B. ; Xu,W. ; Ren,S. X. ; Chen,G. ; Zhen,L. R. ; Chen,X. H. ; Wei,J. ; Zhen,Y. N.

Pub. info.:	Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California. pp.30-37, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3115

Conference Proceedings

9. Analysis of trace organic compounds in vehicle emission using REMPI/TOF-MS

Li,Z. ; Wei,J. ; Xia,Z. ; Gu,X. ; Zhang,L. ; Kong,X. ; Zheng,H. ; Zhang,B.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.199-202, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

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Conference Proceedings

10. Characterization of surface oxidation on rare-earth Er film x-ray laser target

Wu,Y. ; Chen,L. ; Zhang,Z. ; Wei,J. ; Qin,S. ; Tang,W.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.360-363, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

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Author: Wei,J.