1.

Conference Proceedings

Conference Proceedings
Cabanski,W.A. ; Breiter,R. ; Koch,R. ; Mauk,K.-H. ; Rode,W. ; Ziegler,J. ; Schneider,H. ; Walther,M. ; Oelmaier,R.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.547-558,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
2.

Conference Proceedings

Conference Proceedings
Fuchs,F. ; Weimar,U. ; Ahlswede,E. ; Pletschen,W. ; Schmitz,J. ; Walther,M.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.14-21,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
3.

Conference Proceedings

Conference Proceedings
Cabanski,W.A. ; Breiter,R. ; Koch,R. ; Mauk,K.-H. ; Rode,W. ; Ziegler,J. ; Eberhardt,K. ; Oelmaier,R. ; Schneider,H. ; Walther,M.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.113-121,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
4.

Conference Proceedings

Conference Proceedings
Breiter,R. ; Cabanski,W.A. ; Koch,R. ; Rode,W. ; Ziegler,J. ; Eberhardt,K. ; Oelmaier,R. ; Walther,M.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.397-406,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
5.

Conference Proceedings

Conference Proceedings
Breiter,R. ; Cabanski,W.A. ; Ziegler,J. ; Walther,M. ; Schneider,H.
Pub. info.: Thermosense XXII: 25-27 April 2000, Orlando, Florida.  pp.257-266,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4020
6.

Conference Proceedings

Conference Proceedings
Mikulla,M. ; Schmitt,A. ; Walther,M. ; Kiefer,R. ; Moritz,R. ; Muller,S. ; Sah,R.E. ; Braunstein,J. ; Weimann,G.
Pub. info.: In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California.  pp.80-85,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3628
7.

Conference Proceedings

Conference Proceedings
Schneider,H. ; Walther,M. ; Fleissner,J. ; Rehm,R. ; Diwo,E. ; Schwarz,K. ; Koidl,P. ; Weimann,G. ; Ziegler,J. ; Breiter,R. ; Cabanski,W.A.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.353-362,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
8.

Conference Proceedings

Conference Proceedings
Rehm,R. ; Schneider,H. ; Schwarz,K. ; Walther,M. ; Koidl,P. ; Weimann,G.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.379-385,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
9.

Conference Proceedings

Conference Proceedings
Schneider,H. ; Koidl,P. ; Walther,M. ; Lao,Z. ; Schlechtweg,M.
Pub. info.: Materials and electronics for high-speed and infrared detectors : 19-20 and 23 July 1999, Denver, Colorado.  pp.47-53,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3794
10.

Conference Proceedings

Conference Proceedings
Braunstein,J. ; Mikulla,M. ; Kiefer,R. ; Walther,M. ; Jandeleit,J. ; Brandenburg,W. ; Loosen,P. ; Poprawe,R. ; Weimann,G.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.17-22,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945