Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA. pp.547-558, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California. pp.14-21, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.113-121, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida. pp.397-406, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.80-85, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA. pp.353-362, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.379-385, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Materials and electronics for high-speed and infrared detectors : 19-20 and 23 July 1999, Denver, Colorado. pp.47-53, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.17-22, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering