1.

Conference Proceedings
Conference Proceedings
1. CORRELATION OF STRESS RELAXATION AND MICROSTRUCTURE CHANCE IN POLYCRYSTALLINE THIN FILMS ON SUBSTRATES: Au ON Si <10> AT RT
Vermeulen, A. C. ; Delhez, R. ; Mittemeijer, E. J.
Pub. info.: Phase transformation kinetics in thin films : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A..  pp.103-108,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 230
2.

Conference Proceedings
Conference Proceedings
2. Determination of Alignment Errors in Classical XRD Residual Stress Methods
Vermeulen, A. C. ; Houtman, E.
Pub. info.: ECRS 5 : proceedings of the Fifth European Conference on Residual Stresses : held September 28-30, 1999 in Delft-Noordwijkerhout, The Netherlands.  pp.17-22,  2000.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 347-349
3.

Conference Proceedings
Conference Proceedings
3. The Sensitivity of Focusing, Parallel Beam and Mixed Optics to Alignment Errors in XRD Residual Stress Measurements
Vermeulen, A. C.
Pub. info.: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.131-136,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 490-491
4.

Conference Proceedings
Conference Proceedings
4. Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
Vermeulen, A. C. ; Delhez, R.
Pub. info.: EPDIC 8 : proceedings of the eighth European Powder Diffraction Conference, held May 23-26, 2002 in Uppsala, Sweden.  pp.127-130,  2004.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 443-444