1.

Conference Proceedings
Conference Proceedings
1. Development of New High Oil Contained Powder (Powder Gel) and Application to Powder Make-up
Hotta, H. ; Yago, Y. ; Tsuchiya, R. ; Sasaki, M. ; Sugasawa, H. ; Minami, K. ; Minami, T. ; Suzuki, T.
Pub. info.: Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan.  pp.1021-1024,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 132
2.

Conference Proceedings
Conference Proceedings
2. Oxide Quantum Structures for Future Electrophotonics
Kawasaki, M. ; Ohtomo, A. ; Tsuchiya, R. ; Nishino, J. ; Koinuma, H.
Pub. info.: Epitaxial oxide thin films III : symposium held March 31-April 2, 1997, San Francisco, California, U.S.A..  pp.303-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 474
3.

Technical Paper
Technical Paper
3. A Mercury - Free CFL Backlight for Car - Navigation Display.
Noguchi, H. ; Tsuchiya, R. ; Yano, H. ; Nakamura, H.
Pub. info.: 2002 SAE world congress : technical paper.  2002.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2002
4.

Conference Proceedings
Conference Proceedings
4. Characterization of line-edge roughness in resist patterns and estimations of its effect on device performance
Yamaguchi, A. ; Tsuchiya, R. ; Fukuda, H. ; Komuro, O. ; Kawada, H. ; Iizumi, T.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.689-698,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
5.

Conference Proceedings
Conference Proceedings
5. Metrology of LER: influence of line-edge roughness (LER) on transistor performance
Yamaguchi, A. ; Ichinose, K. ; Shimamoto, S. ; Fukuda, H. ; Tsuchiya, R. ; Ohnishi, K. ; Kawada, H. ; Iizumi, T.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.468-476,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375