1.

Conference Proceedings
Conference Proceedings
1. Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources
Poletto,L. ; Tondello,G.
Pub. info.: X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA.  pp.182-202,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4138
2.

Conference Proceedings
Conference Proceedings
2. First realization and characterization of multilayer EUV reflective coatings
Nicolosi,P. ; Patelli,A. ; Pelizzo,M.G. ; Rigato,V. ; Maggioni,G. ; Depero,L. ; Bontempi,E. ; Mattei,G. ; Poletto,L. ; Mazzoldi,P. ; Tondello,G.
Pub. info.: Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA.  pp.76-83,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4506
3.

Conference Proceedings
Conference Proceedings
3. Stray light evaluation of the Ultraviolet and Visible-light Coronagraph Imager (UVCI) rocket prototype
Romoli,M. ; Landini,F. ; Fineschi,S. ; Gardiol,D. ; Naletto,G. ; Malvezzi,M. ; Tondello,G. ; Noci,G.C. ; Antonucci,E.
Pub. info.: UV/EUV and visible space instrumentation for astronomy and solar physics : 1-2 August 2001, San Diego, USA.  pp.27-38,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4498
4.

Conference Proceedings
Conference Proceedings
4. Ultraviolet Italian Shy Surveyor (UVISS) on the International Space Space Station (ISS): study report
Bernacca,P.L. ; Antonello,E. ; Bertola,F. ; Martinez,A.P. ; Stalio,R. ; Catalano,S. ; Maraschi,L. ; Rodono,M. ; Tondello,G. ; Villa,G.E. ; Badiali,M. ; Bonanno,G. ; Bucconi,A. ; Buson,L. ; Cardini,D. ; Cavaliere,A. ; Ceccherini,P. ; Martino,D.de ; Valle,M.Della ; Emanuele,A.
Pub. info.: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.199-210,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4139
5.

Conference Proceedings
Conference Proceedings
5. Soft x-ray(2 to 6 keV)spectroscopy using gratings at extreme grazing incidence
Boscolo,A. ; Poletto,L. ; Tondello,G.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.260-266,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
6.

Conference Proceedings
Conference Proceedings
6. Performances of a CCD camera from 1-to 1100-nm spectral region
Poletto,L. ; Boscolo,A. ; Pelizzo,M.G. ; Placentino,L. ; Tondello,G.
Pub. info.: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.132-141,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3100
7.

Conference Proceedings
Conference Proceedings
7. Quantum efficiency measurement on a CCD detector in the 0.3-to 1100-nm spectral region
Poletto,L. ; Boscolo,A. ; Pelizzo,M. G. ; Placentino,L. ; Tondello,G.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.  pp.617-624,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3114
8.

Conference Proceedings
Conference Proceedings
8. Ultraviolet and visible-light coronagraph for the Solar Orbiter mission
Antonucci,E. ; Fineschi,S. ; Gardiol,D. ; Noci,G.C. ; Romoli,M. ; Naletto,G. ; Tondello,G. ; Zattarin,M. ; Malvezzi,A.M. ; Cesare,S.
Pub. info.: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.378-389,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4139
9.

Conference Proceedings
Conference Proceedings
9. Monchromator for the synchrotron radiation beamline X-MOSS at ELETTRA
Naletto,G. ; Pelizzo,M.-G. ; Tondello,G. ; Nannarone,S. ; Giglia,A.
Pub. info.: Advances in X-ray optics : 2-4 August 2000, San Diego, USA.  pp.105-113,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4145
10.

Conference Proceedings
Conference Proceedings
10. EUV and soft x-ray telescope-spectrometer for imaging spectroscopy on the Solar Orbiter mission: grazing-incidence configuration
Poletto,L. ; Tondello,G. ; Landini,M.
Pub. info.: UV/EUV and visible space instrumentation for astronomy and solar physics : 1-2 August 2001, San Diego, USA.  pp.39-50,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4498