1.

Conference Proceedings

Conference Proceedings
Gao, H. ; Guo, D. ; Zhang, H. ; Tian, R.
Pub. info.: Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China.  pp.642103-642103,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6421
2.

Conference Proceedings

Conference Proceedings
Demircan, E. ; Tian, R. ; Grobman, W.D.
Pub. info.: Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA.  pp.555-565,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4692
3.

Conference Proceedings

Conference Proceedings
Lucas, K.D. ; Yuan, C.-M. ; Boone, R. ; Strozewski, K. ; Porter, J. ; Tian, R. ; Wimmer, K. ; Cobb, J. ; Wilkinson, B. ; Toublan, O.
Pub. info.: Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA.  pp.158-169,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5379
4.

Conference Proceedings

Conference Proceedings
Xu, G. ; Tian, R. ; Pan, D. Z. ; Wong, M. D. F.
Pub. info.: 24th Annual BACUS Symposium on Photomask Technology.  pp.340-350,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5567
5.

Conference Proceedings

Conference Proceedings
Xu, G. ; Tian, R. ; Wong, M.D. ; Reich, A.J.
Pub. info.: 23rd Annual BACUS Symposium on Photomask Technology.  pp.185-194,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5256
6.

Conference Proceedings

Conference Proceedings
Yuan, C.-M. ; Jarvis, B. ; Lucas, K.D. ; Boone, R. ; Tian, R. ; Reich, A.
Pub. info.: Optical Microlithography XVII.  pp.1121-1129,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5377