Hong, M.Y. ; Theodore, N.D. ; Steele, J. ; See, Y-C.
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Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.288-297, 1994. Pennington, NJ. Electrochemical Society
Theodore, N.D. ; Mei, P. ; Schwarz, S.A. ; Carter, C.B. ; Palmstrom, C. ; Harbison, J.P. ; Florez, L.T.
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Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.709-714, 1990. Pittsburgh, Pa.. Materials Research Society
Vengurlekar, A. ; Ashok, S. ; Kalnas, C.E. ; Theodore, N.D.
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Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.325-332, 2004. Warrendale, Pa.. Materials Research Society
Vengurlekar, A. ; Balasubramanian, Satheesh ; Ashok, S. ; Theodore, N.D. ; Chi, D.Z.
Pub. info.:
Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.159-164, 2004. Warrendale, Pa.. Materials Research Society
Bauer, M. ; Zollner, S. ; Theodore, N.D. ; Canonico, M. ; Tomasini, P. ; Nguyen, B.-Y. ; Arena, C.
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Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.143-150, 2005. Warrendale, Pa.. Materials Research Society
Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.. pp.377-382, 1989. Pittsburgh, Pa.. Materials Research Society