1.

Conference Proceedings
Conference Proceedings
1. Real-Time Spectroscopic Ellipsometry as an In Situ Probe of the Growth Dynamics of Amorphous and Epitaxial Crystal Silicon for Photovoltaic Applications
Levi, D.H. ; Teplin, C.W. ; Iwaniczko, E. ; Yan, Y. ; Wang, T.H. ; Branz, H.M.
Pub. info.: Amorphous and nanocrystalline silicon science and technology - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.159-170,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 862
2.

Conference Proceedings
Conference Proceedings
2. Materials and Interface Optimization of Heterojunction Silicon (HIT) Solar Cells Using In Situ Real-Time Spectroscopic Ellipsometry
Levi, D.H. ; Teplin, C.W. ; Iwaniczko, E. ; Ahrenkiel, R.K. ; Branz, H.M. ; Page, M.R. ; Yan, Y. ; Wang, Q. ; Wang, T.H.
Pub. info.: Amorphous and nanocrystalline silicon science and technology - 2004 : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.239-244,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 808
3.

Conference Proceedings
Conference Proceedings
3. Advances in thin film photonics: materials, science, and technology
Fortmann, C.M. ; Tonucci, R.J. ; Anderson, W.A. ; Teplin, C.W. ; Mahan, A.H.
Pub. info.: Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications IX.  pp.14-23,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5206