1.

Conference Proceedings
Conference Proceedings
1. Avalanche multiplication and noise in submicron Si p-i-n diodes
Tan,C.H. ; David,J.P.R. ; Clark,J. ; Rees,G.J. ; Plimmer,S.A. ; Robbins,D.J. ; Herbert,D.C. ; Carline,R.T. ; Leong,W.Y.
Pub. info.: Silicon-based optoelectronics II : 28 January 2000, San Jose, California.  pp.95-102,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3953
2.

Conference Proceedings
Conference Proceedings
2. Avalanche multiplication noise in bulk and thin AixGa1-xAs (x=0-0.8) PIN and NIP diodes
Ng,B.K. ; David,J.P.R. ; Tan,C.H. ; Plimmer,S.A. ; Rees,G.J. ; Tozer,R.C. ; Hopkinson,M.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.39-46,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
3.

Conference Proceedings
Conference Proceedings
3. Exposure tool chuck flatness study and effects on lithography
Mukherjee-Roy,M. ; Tan,C.H. ; Tan,Y.K. ; Samudra,G.S.
Pub. info.: Lithography for semiconductor manufacturing II : 30 May-1 June, 2001, Edinburgh, UK.  pp.14-25,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4404
4.

Conference Proceedings
Conference Proceedings
4. Design of low-noise avalanche photodiodes
David,J.P.R. ; Tan,C.H. ; Plimmer,S.A. ; Rees,G.J. ; Tozer,R.C. ; Robson,P.N.
Pub. info.: Optoelectronic integrated circuits IV : 26-27 January 2000, San Jose, California.  pp.30-38,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3950