1.

Conference Proceedings
Conference Proceedings
1. RADIAL DISTRIBUTION OF THERMALLY-INDUCED DEFECTS IN HEAVILY BORON-DOPED SILICON WAFERS
Asayama, E. ; Ono, T. ; Takeshita, M. ; Hourai, M. ; Sano, M. ; Tsuya, H.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.546-556,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(1)
2.

Conference Proceedings
Conference Proceedings
2. Characteristics of piezoelectric damper in smart structural system
Kitagawa, Y. ; Takeshita, M. ; Tamai, H. ; Miura, K.
Pub. info.: Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA.  pp.197-206,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5057