1.

Conference Proceedings
Conference Proceedings
1. Development of an Uncertainty Analysis Methodology Associated With the Characterization of the Geological Environment: Study on its Applicability in the Tono Area
Yanagizawa, K. ; Takeda, S. ; Osawa, H. ; Suyama, Y. ; Takae, H. ; Toida, M. ; Mefcalfe, R.
Pub. info.: Scientific basis for nuclear waste management XXIX : symposium held September 12-16, 2005, Ghent, Belgium.  pp.219-226,  2006.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 932
2.

Conference Proceedings
Conference Proceedings
2. Results of a Si/cdTe Compton Telescope [5922-18]
Oonuki, K. ; Tanaka, T. ; Watanabe, S. ; Takeda, S. ; Nakazawa, K. ; Mitani, T. ; Takahashi, T. ; Tajima, H. ; Fukazawa, Y. ; Nomachi, M.
Pub. info.: Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California.  pp.59220J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5922
3.

Conference Proceedings
Conference Proceedings
3. Electrolytic Oxidation Treatment of Dye-Containing Colored Waste Water Using Solid Polymer Electrolyte Membrane
Yamane, M. ; Murakami, S. ; Takeda, S. ; Siroma, Z. ; Wakida, S.-i.
Pub. info.: Environmental aspects of electrochemical technology : proceedings of the international symposium.  pp.219-224,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-39
4.

Conference Proceedings
Conference Proceedings
4. FET Based pH and Nitrate Checkers for Acid-Rain Monitoring
Wakida, S. ; Yamane, M. ; Takeda, S. ; Siroma, Z. ; Tsujimura, Y. ; Liv, J.
Pub. info.: Microfabricated Systems and MEMS V : proceedings of the International Symposium.  pp.169-174,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-19
5.

Conference Proceedings
Conference Proceedings
5. CHARACTERIZATION OF DEFECTS IN Gap, GaAs AND GaAs1-xPx ELECTROLUMINESCENT DIODES BY TRANSMISSION ELECTRON MICROSCOPE
Hirata, M. ; Takeda, S. ; Fujii, K.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.495-498,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
6.

Conference Proceedings
Conference Proceedings
6. ATOMIC STRUCTURES OF PLANAR DEFECTS IN Si AND GaAs
Takeda, S. ; Muto, S. ; Hirata, M.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.209-214,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
7.

Conference Proceedings
Conference Proceedings
7. Studies on pH and Nitrate Sensors Based on ISFETs for Acid-Rain Monitoring
Wakida, S.-I. ; Yamane, M. ; Takeda, S. ; Siroma, Z. ; Tsujimura, Y. ; Liu, J.
Pub. info.: Chemical sensors IV : proceedings of the symposium.  pp.404-406,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-23
8.

Conference Proceedings
Conference Proceedings
8. Tight-Binding Calculations of Complex Defects in Semiconductors: Comparison With Ab Initio Results
Kohyama, M. ; Arai, N. ; Takeda, S.
Pub. info.: Tight-binding approach to computational materials science : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A..  pp.287-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 491
9.

Conference Proceedings
Conference Proceedings
9. Boron Clusters in a Complex Defect in Silicon
Okamoto, M. ; Takayanagi, K. ; Takeda, S.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.343-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
10.

Conference Proceedings
Conference Proceedings
10. Mesoscopic characterization of the optical property of antiphase boundaries in CuPt-ordered GaInP2
Ohno, Y. ; Takeda, S.
Pub. info.: Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.105-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 588