Three-dimensional and multidimensional microscopy : image acquisition and processing XIV : 23-25 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
S. Tsurekawa ; H. Fujii ; V.A. Yardley ; T. Matsuzaki ; T. Watanabe
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