Tikhonravov, A. ; Trubetskov, M. ; Amochkina, T. ; Kokarev, M. ; Kaiser, N. ; Stenzel, O. ; Wilbrandt, S. ; Gabler, D.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.596304-596304, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bruckner, C. ; Pradarutti, B. ; Reihemann, S. ; Stenzel, O. ; Steinkopf, O. ; Gebhardt, A. ; Notni, G. ; Tunnermann, A.
Pub. info.:
Millimeter-wave and terahertz photonics : 5-6 April 2006, Strasbourg, France. pp.61940N-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.21-28, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.46-55, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59631N-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Janicki, V. ; Lappschies, M. ; Gortz, B. ; Ristau, D. ; Schallenberg, U. ; Stenzel, O. ; Kaiser, N.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59631O-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Leitel, R. ; Petschulat, J. ; Kaless, A. ; Schulz, U. ; Stenzel, O. ; Kaiser, N.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59651O-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ehlers, H. ; Becker, K.-J. ; Beckmann, R. ; Beermann, N. ; Brauneck, U. ; Fuhrberg, P. ; Gaebler, D. ; Jakobs, S. ; Kaiser, N. ; Kennedy, M. ; Koenig, F. ; Laux, S. ; Mueller, J.C. ; Rau, B. ; Riggers, W. ; Ristau, D. ; Schaefer, D. ; Stenzel, O.
Pub. info.:
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.646-655, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wilbrandt, S. ; Stenzel, O. ; Gabler, D. ; Kaiser, N.
Pub. info.:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany. pp.59630F-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering