1.

Conference Proceedings
Conference Proceedings
1. Real Time Spectroscopic Ellipsometry: A New Tool to Characterize SOI Wafers
Boher, P. ; Piel, J.P. ; Stehle, J.L.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.249-256,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
2.

Conference Proceedings
Conference Proceedings
2. * Characterization of ultra-thin Gate Dielectrics by Grazing X-Ray Reflectance and Spectroscopic Ellipsometry on the Same Instrument
Boher, P. ; Stehle, J.L. ; Defranoux, C. ; Bourtault, S. ; Piel, J.P. ; Evrard, P.
Pub. info.: Rapid thermal and other short-time processing technologies II : proceedings of the international symposium.  pp.67-78,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-9
3.

Conference Proceedings
Conference Proceedings
3. SPECTROSCOPIC ELLIPSOMETRY AS A NON-DESTRUCTIVE TECHNIQUE FOR CHARACTERIZATION OF ATOMIC-SCALE INTERFACES
Stehle, J.L. ; Piel, J.P. ; Lecat, J.H. ; Pickering, C. ; Hammond, L.C.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.459-464,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
4.

Conference Proceedings
Conference Proceedings
4. Polarized gonio fluorimetric measurements of DNA-chip: a step forward Towards fluorescence quantification
Barritault, P. ; Getin, S. ; Chaton, P. ; Vinet, F. ; Fouquee, B. ; Stehle, J.L.
Pub. info.: Biomedical nanotechnology architectures and applications : 20-24 January 2002, San Jose, USA.  pp.9-16,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4626