1.

Conference Proceedings
Conference Proceedings
1. Electromigration-Induced Plastic Deformation in Cu Damascene Interconnect Lines as Revealed by Synchrotron X-Ray Microdiffraction
Budiman, Arief S. ; Tamura, N. ; Valek, B.C. ; Gadre, k. ; Maiz, J. ; Spolenak, R. ; Patel, J.R. ; Nix, W.D.
Pub. info.: Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A..  pp.295-304,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 914
2.

Conference Proceedings
Conference Proceedings
2. Application of the White/Monochromatic X-Ray μ-Diffraction Technique to the Study of Texture and Triaxial Strain at the Sub-Micron Level
Goudeau, P. ; Tamura, N. ; Spolenak, R. ; Padmore, H. A.
Pub. info.: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.672-677,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 490-491
3.

Conference Proceedings
Conference Proceedings
3. Mechanical properties of electroplated copper thin films
Spolenak, R. ; Volkert, C. A. ; Takahashi, K. ; Fiorillo, S. ; Miner, J. ; Brown, W. L.
Pub. info.: Thin films - stresses and mechanical properties VIII : symposium held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.63-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 594
4.

Conference Proceedings
Conference Proceedings
4. Copper Versus Magnesium as an Alloying Element in Aluminum Interconnects: Effects on Electromigration
Spolenak, R. ; Mason, J. ; Kraft, O. ; Arzt, E.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.269-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
5.

Conference Proceedings
Conference Proceedings
5. Evolution of the Optical Response from a Very Narrow Gap Semiconductor to a Metallic Material in (FexMn1-x)Si
Bocelli, S. ; Marabelli, F. ; Spolenak, R. ; Bauer, E.
Pub. info.: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.361-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 402
6.

Conference Proceedings
Conference Proceedings
6. Microtexture And Strain In Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D10.3/G7.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
7.

Conference Proceedings
Conference Proceedings
7. Reverse Stress Relaxation In Cu Thin Films
Spolenak, R. ; Volkert, C.A. ; Ziegler, S. ; Panofen, C. ; Brown, W.L.
Pub. info.: Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 673
8.

Conference Proceedings
Conference Proceedings
8. Microtexture and Strain in Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A..  pp.G7.3/D10.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 615
9.

Conference Proceedings
Conference Proceedings
9. Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction
Valek, B.C. ; Tamura, N. ; Spolenak, R. ; MacDowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Bravman, J.C. ; Brown, W.L. ; Batterman, B. W. ; Patel, J. R.
Pub. info.: Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 673
10.

Conference Proceedings
Conference Proceedings
10. X-Ray Diffraction as a Probe for Elastic Strain: Micro- and Nanoscale Investigation of Thin Metal Films
Spolenak, R.
Pub. info.: Neutron and x-ray scattering as probes of multiscale phenomena : symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A..  pp.163-174,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 840