1.

Conference Proceedings
Conference Proceedings
1. Photocarrier extraction effect in thin variable-gap photoresistors
Sokolovsky,B.S. ; Pysarevsky,V.K. ; Kovtun,R.M.
Pub. info.: Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA.  pp.254-261,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4454
2.

Conference Proceedings
Conference Proceedings
2. Negative differential photoconductivity of thin graded-bandgap layers in conditions of carrier extraction effect
Sokolovsky,B.S. ; Pysarevsky,V.K. ; Nemolovsky,A.V.
Pub. info.: Fifth international conference on material science and material properties for infrared optoelectronics : 22-24 may 2000, Kiev, Ukraine.  pp.73-78,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4355
3.

Conference Proceedings
Conference Proceedings
3. Doping effect on concentration dependence of the diffusion coefficient in semiconductors
Monastyrskii,L.S. ; Sokolovsky,B.S.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.309-312,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
4.

Conference Proceedings
Conference Proceedings
4. Photosensitivity of graded-bandgap structures with interfacial recombination states
Savitsky,V.G. ; Sokolovsky,B.S. ; Pysarevsky,V.K.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.304-309,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
5.

Conference Proceedings
Conference Proceedings
5. Influence of semiconductor structure inhomogeneity on electrophysical measurement results
Savitsky,V.G. ; Vlasov,A. ; Nemolovsky,A.V. ; Sokolovsky,B.S.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.343-347,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
6.

Conference Proceedings
Conference Proceedings
6. Multilayer structures based on variable-gap semiconductors:carrier redistribution phenomena during current transfer
Savitsky,V.G. ; Sokolovsky,B.S. ; Pysarevsky,V.K.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.337-342,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
7.

Conference Proceedings
Conference Proceedings
7. Analytical calculation of dark voltage-current characteristics of double-layer heterojunction photodiode
Sokolovsky,B.S. ; Pysarevsky,V.K.
Pub. info.: 16th International conference on photoelectronics and night vision devices : 25-27 May 2000 Moscow, Russia.  pp.97-102,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4340