1.

Conference Proceedings
Conference Proceedings
1. Fundamentals of high resolution transmission electron microscopy
Smith J. D.
Pub. info.: Surface and interface characterization by electron optical methods.  pp.31-42,  1988.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 191
2.

Conference Proceedings
Conference Proceedings
2. Profile imaging of small particles, extended surfaces and dynamic surface phenomena
Smith J. D.
Pub. info.: Surface and interface characterization by electron optical methods.  pp.43-54,  1988.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 191
3.

Conference Proceedings
Conference Proceedings
3. HREM of Edge-on Interfaces and Defects
Glaisher W. R. ; Barry C. J. ; Smith J. D.
Pub. info.: Evaluation of advanced semiconductor materials by electron microscopy.  pp.1-17,  1989.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 203