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21 results

Conference Proceedings

1. Microflow meter integrated with an optical sensor (Invited Paper)

Jain,V.K. ; Jalwania,C.R. ; Swarankar,N.K. ; Singh,R.

Pub. info.:	Smart materials, structures, and MEMS : 11-14 December 1996, Bangalore, India. pp.758-770, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3321

Conference Proceedings

2. Description and applications of high-brightness multi-laser-diode system

Singh,R. ; Chin,A.K. ; Zu,Q. ; Dabkowski,F.P. ; Jollay,R.A. ; Bull,D.J. ; Fanelli,J. ; Goodman,D.S. ; Roblee,J.W. ; Plummer,W.T.

Pub. info.:	Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.32-41, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3945

Conference Proceedings

3. Comparison of ML parameter estimation and neural network classifier for texture classification

Singh,R. ; Vasquez,R.E. ; Singh,R.

Pub. info.:	Applications of artificial neural networks in image processing II : 12-13 February, 1997, San Jose, California. pp.60-69, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3030

Conference Proceedings

4. Ion Beam Milling of n-Type Mercury Cadmium Telluride for Photoconductive Devices

Vandna Mittal ; Singh,K.P. ; Singh,R. ; Gopal,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.799-802, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

5. Some Critical Processes in the Fabrication of(Hg1-xCdx)Te Photoconductive Linear Arrays

Vandna Mittal ; Monga,K. ; Pathak,H.T. ; Singh,R. ; Gopal,V. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.803-805, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

6. Generation of microstructures in silicon for MEMS applications

Gupta,A. ; Pal,M. ; Puri,P.P. ; Singh,R. ; Ahuja,D.S.

Pub. info.:	Smart materials, structures, and MEMS : 11-14 December 1996, Bangalore, India. pp.222-230, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3321

Conference Proceedings

7. Experimental Characterization of Nonlinear Rubber Mounts

Richards,C.M. ; Singh,R.

Pub. info.:	Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas. Part2 pp.1678-1684, 2000. Bethel, CT. Society for Experimental Mechanics
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4062

Conference Proceedings

8. Conditioned Frequency Response Estimators for Nonlinear Systems,#161

Richards,C.M. ; Singh,R.

Pub. info.:	Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida. Part2 pp.1210-1216, 1999. Bethel, CT. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3727

Conference Proceedings

9. Feasibility of Identifying Nonlinear Multi-Degree-of-Freedom Systems with Unknown Polynomial Forms

Richards,C.M. ; Singh,R.

Pub. info.:	Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas. Part1 pp.496-502, 2000. Bethel, CT. Society for Experimental Mechanics
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4062

10.

Conference Proceedings

10. Edge detection:conventional operators vis-a-vis wavelets

Singh,R. ; Vasquez,R.E. ; Singh,R.

Pub. info.:	Proceedings of three-dimensional microscopy : image acquisition and processing IV : 12-13 February 1997, San Jose, California. pp.169-177, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2984

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