1.

Conference Proceedings
Conference Proceedings
1. Minority Carrier Lifetime and Impurity Level Scan Map in Silicon
Palais, O. ; Yakimov, E. ; Simon, J.J. ; Martinuzzi, S.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.396-402,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. Evolution of Defects Induced by High Energy He Implantation in Gold-Diffused Silicon
Bouayadi, R. El ; Regula, G. ; Pichaud, B. ; Lancin, M. ; Simon, J.J. ; Ntsoenzok, E.
Pub. info.: Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 669
3.

Conference Proceedings
Conference Proceedings
3. Iron concentration mapping in monocrystalline silicon wafers
Palais, O. ; Simon, J.J. ; Yakimov, E. ; Martinuzzi, S.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.233-240,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29