1.

Conference Proceedings
Conference Proceedings
1. A SIMPLE, NON-DESTRUCTIVE OPTICAL TECHNIQUE TO CHARACTERIZE ION-IMPLANTED SEMICONDUCTOR WAFERS
Young, J.F. ; Jensen, H.R. ; Simard-Normandin, M.
Pub. info.: Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.83-92,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 52
2.

Conference Proceedings
Conference Proceedings
2. OPTICAL PROPERTIES OF METAL FILMS AND THEIR SILICIDES
Simard-Normandin, M. ; Naem, A. ; Saran, M.
Pub. info.: Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.461-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 337
3.

Conference Proceedings
Conference Proceedings
3. Watching semiconductor circuitry work [5969D-105]
Hulse, J. E. ; Sarault, K. ; Simard-Normandin, M. ; Tarr, N. G. ; Bardwell, J. A.
Pub. info.: Photonic Applications in Biosensing and Imaging.  pp.59692U-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5969