1.

Conference Proceedings
Conference Proceedings
1. CONTAMINATION EFFECTS ON OXIDE BREAKDOWN PROPERTIES
Sees, Jennifer ; Hall, Lindsey ; Prasad, Jagdish ; Schleisman, Anthony ; Niccoli, John
Pub. info.: Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.13-20,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-20
2.

Conference Proceedings
Conference Proceedings
2. SURFACE ANALYSIS OF Si(100) WAFERS PROCESSED IN VANADIUM SPIKED DILUTE HF SOLUTIONS
Prasad, Jagdish ; Sees, Jennifer ; Lester, Lisa ; Douglas, Monte ; Templeton, Allen ; Hall, Lindsey
Pub. info.: Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.492-499,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-20