1.

Conference Proceedings

Conference Proceedings
Weitkamp,T. ; Rau,C. ; Snigirev,A.A. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Schroer,C.G.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.92-102,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
2.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Rau,C. ; Weitkamp,T. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.23-33,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
3.

Conference Proceedings

Conference Proceedings
Rau,C. ; Weitkamp,T. ; Snigirev,A.A. ; Schroer,C.G. ; Benner,B. ; Tummler,J. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Krill Ⅲ,C.E. ; Dobrich,K.M. ; Michels,D. ; Michels,A.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.14-22,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
4.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Lengeler,B. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Simionovici,A.S. ; Bohic,S. ; Drakopoulos,M. ; Snigirev,A.A. ; Snigireva,I. ; Schroder,W.H.
Pub. info.: X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA.  pp.52-63,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4499
5.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Benner,B. ; Gunzler,T.F. ; Kuhlmann,M. ; Lengeler,B. ; Schroder,W.H. ; Kuhn,A.J. ; Simionovici,A.S. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.230-239,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
6.

Conference Proceedings

Conference Proceedings
Simionovici,A.S. ; Chukalina,M. ; Vekemans,B. ; Lemelle,L. ; Gillet,Ph. ; Schroer,C.G. ; Lengeler,B. ; Schroder,W.H. ; Jeffries,T.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.222-229,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
7.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Lengeler,B. ; Benner,B. ; Kuhlmann,M. ; Gunaler,T.F. ; Tummler,J. ; Rau,C. ; Weitkamp,T. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Advances in X-ray optics : 2-4 August 2000, San Diego, USA.  pp.274-284,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4145
8.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Tummler,J. ; Lengeler,B. ; Drakopoulos,M. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: X-ray FEL optics and instrumentation : 30-31 July 2001, San Diego, USA.  pp.60-68,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4143
9.

Conference Proceedings

Conference Proceedings
Schroer,C.G. ; Tummler,J. ; Gunzler,T.F. ; Lengeler,B. ; Schroder,W.H. ; Kuhn,A.J. ; Simionovici,A.S. ; Snigirev,A.A. ; Snigireva,I.
Pub. info.: Penetrating Radiation Systems and Applications II.  pp.287-296,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4142