1.

Conference Proceedings

Conference Proceedings
Strepikhova,M. ; Jantsch,W. ; Kosher,G. ; Schoisswohl,M. ; Cantin,J.P. ; Bardeleben,H.J.von
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1533-1538,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Przybylinska,H. ; Enzenhofer,J. ; Hendorfer,G. ; Schoisswohl,M. ; Palmetshofer,L. ; Jantsch,W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.715-720,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147