1.

Conference Proceedings

Conference Proceedings
Oku,T. ; Adachi,T. ; Sato,H. ; Otani,C. ; Takizawa,Y. ; Sakai,K. ; Shimizu,H.M. ; Sasaki,K. ; Iwasa,H. ; Kamiyama,T. ; Kiyanagi,Y. ; Ino,T. ; Furusaka,M. ; Suzuki,J. ; Hino,M. ; Tasaki,S. ; Ebisawa,T.
Pub. info.: Neutron optics : 2 August 2001, San Diego, USA.  pp.96-105,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4509
2.

Conference Proceedings

Conference Proceedings
Piao,Z.S. ; Tani,M. ; Sakai,K.
Pub. info.: Terahertz spectroscopy and applications : 25-26 January 1999, San Jose, California.  pp.49-56,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3617
3.

Conference Proceedings

Conference Proceedings
Tani,M. ; Fukasawa,R. ; Herrmann,M. ; Sakai,K. ; Nakashima,S. ; Yoshioka,N. ; Ishida,A. ; Fujiyasu,H.
Pub. info.: Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California.  pp.109-118,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3624
4.

Conference Proceedings

Conference Proceedings
Ohno,M. ; Yamamoto,K. ; Kokubo,A. ; Sakai,K. ; Takagi,K.
Pub. info.: Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California.  pp.359-366,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3585
5.

Conference Proceedings

Conference Proceedings
Funada,M. ; Ozeki,S. ; Hamada,T. ; Sakai,K. ; Shiotani,T. ; Hirota,M. ; Kyozuka,S. ; Okada,J. ; Kobayashi,K. ; Fujimagari,H. ; Ozawa,T.
Pub. info.: Optoelectronic interconnects VI : 27-29 January 1999, San Jose, California.  pp.30-35,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3632
6.

Conference Proceedings

Conference Proceedings
Piao,Z.S. ; Tani,M. ; Sakai,K.
Pub. info.: Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California.  pp.184-191,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3940
7.

Conference Proceedings

Conference Proceedings
Kuriyama,K. ; Sakai,K. ; Kato,T. ; Iijima,T. ; Okada,M. ; Yokoyama,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1443-1448,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
8.

Conference Proceedings

Conference Proceedings
Sakai,K. ; Ogawa,T.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part3  pp.1283-1288,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
9.

Conference Proceedings

Conference Proceedings
Hayashi,N. ; Watanabe,H. ; Sakai,K. ; Kuriyama,K. ; Ikeda,Y. ; Maekawa,H. ; Miura,T.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1243-1248,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
10.

Conference Proceedings

Conference Proceedings
Ae,T. ; Sakai,K. ; Araki,H. ; Honda,N.
Pub. info.: Applications of artificial neural networks in image processing IV : 28-29 January 1999, San Jose, California.  pp.154-163,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3647