1.

Conference Proceedings
Conference Proceedings
1. Wafer-level stress data successfully used as early burn-in predictor
Sacedon,A. ; Merino,M.A. ; Martin,V. ; Inarrea,J. ; Sanchez-Vicente,F.J. ; Hoz,J.de la ; Ayucar,J.A. ; Menendez-Moran,I. ; Riloba,A. ; Mata,C. ; Recio,M.
Pub. info.: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK.  pp.180-184,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4406
2.

Conference Proceedings
Conference Proceedings
2. Incorporation of Be into InxGa1-xAs(0.004｡蛉｡？.17)Studied by Photoluminescence and Resonant Raman Spectroscopy of Local Vibrational Modes
Alvarez,A.L. ; Wagner,J. ; Calle,F. ; Maier,M. ; Gutierrez,G. ; Sacedon,A. ; Calleja,E. ; Mufioz,E.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.241-246,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Toward 100% yield understanding approach in Lucent Technologies Madrid
Recio,M. ; Merino,M.A. ; Mata,C. ; Martin,V. ; Ayucar,J.A. ; Moreno,J. ; Godino,A. ; Lorenzo,A. ; Sacedon,A. ; Fernandez,R. ; Morilla,C. ; Inarrea,J. ; Alvarez,M. ; Fernandez,A. ; Therryl,K. ; Mateos,C. ; Gonzalez,G. ; Cruceta,S. ; Castano,J.
Pub. info.: Process Control and Diagnostics.  pp.12-19,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4182
4.

Conference Proceedings
Conference Proceedings
4. Corrective actions for stainless-steel-particle-related burn-in failures
Sacedon,A. ; Inarrea,J. ; Alvarez,M. ; Prieto,P. ; Plaza,J.C. ; Hernandez,J.L. ; Martinez,C. ; Fernandez,S. ; Dominguez,P.S. ; Gonzalez,J.P. ; Larran,M. ; Mata,C.
Pub. info.: Process Control and Diagnostics.  pp.194-201,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4182