1.

Conference Proceedings
Conference Proceedings
1. Effects of Electron Beam Preheating on Silicon Wafer Bonding
Ryoo, K. ; Kang, S. ; Kim, H. ; Kim, D. ; Moon, D.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.79-86,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
2.

Conference Proceedings
Conference Proceedings
2. Characterization of interfaces in silicon-on-insulator structure
Kang, S.G. ; Ryoo, K. ; Kim, H.R. ; Seo, G. ; Lee, S.H. ; Kim, D.S. ; Hong, P.Y
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.203-216,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
3.

Conference Proceedings
Conference Proceedings
3. CHARACTERIZATION OF PRECIPITATES DECORATING STACTING FAULTS IN SINGLE CRYSTAL SILICON
Ryoo, K. ; Drosd, R. ; Wood, W.E.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.17-24,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62