1.

Conference Proceedings

Conference Proceedings
Wenus,J. ; Rutkowski,J. ; Adamiec,K. ; Kubiak,L. ; Madejczyk,P.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.363-368,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Madejczyk,P. ; Rutkowski,J. ; Gawron,W. ; Kubiak,L. ; Wenus,J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.357-362,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings

Conference Proceedings
Kubiak,L. ; Adamiec,K. ; Madejczyk,P. ; Wenus,J. ; Martyniuk,P. ; Rutkowski,J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.96-101,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
4.

Conference Proceedings

Conference Proceedings
Rutkowski,J. ; Adamiec,K. ; Rogalski,A.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.327-335,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
5.

Conference Proceedings

Conference Proceedings
Adamiec,K. ; Rutkowski,J. ; Bednarek,S. ; Michalski,E.
Pub. info.: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.25-27,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3179
6.

Conference Proceedings

Conference Proceedings
Rutkowski,J. ; Wenus,J. ; Gawron,W. ; Adamiec,K.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.310-315,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
7.

Conference Proceedings

Conference Proceedings
Gawron,W. ; Rutkowski,J. ; Raczyriska,J. ; Adamiec,K. ; Larkowski,W.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.316-320,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
8.

Conference Proceedings

Conference Proceedings
Rutkowski,J. ; Rogalski,A. ; Adamiec,K.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.416-423,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629
9.

Conference Proceedings

Conference Proceedings
Mycielski,A. ; Szadkowski,A. ; Lusakowska,E. ; Kowalczyk,L. ; Domagafa,J. ; Bak-Misiuk,J. ; Witkowska,B. ; Adamiec,K. ; Rutkowski,J. ; Jedrzejczak,A.
Pub. info.: Single crystal growth, characterization, and applications : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.10-17,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3724
10.

Conference Proceedings

Conference Proceedings
Adamiec,K. ; Rutkowski,J. ; Rogalski,A. ; Gawron,W. ; Wenus,J. ; Larkowski,W.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.382-388,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948