1.

Conference Proceedings
Conference Proceedings
1. EBIC and TEM Study of Process Induced Defects in SOI Wafers
Bondarenko,I.E. ; Kononchuk,O.V. ; Rozgonyi,G.A.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.32-38,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
2.

Conference Proceedings
Conference Proceedings
2. Novel GOI Failure Analysis Using SEM/MOS/EBIC with SubNano Ampere Current Breakdown
Tamatsuka,M. ; Oka,S. ; Kirk,H.R. ; Rozgonyi,G.A.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.80-91,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
3.

Conference Proceedings
Conference Proceedings
3. Effect of Oxidation Induced Stacking Fault (OSF) Ring on Generation and Motion of Slip Dislocation
Gonzalez,F. ; Thakur,R.P.S. ; Bondarenko,I. ; Zhong,Q. ; Rozgonyi,G.A.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.223-234,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
4.

Conference Proceedings
Conference Proceedings
4. Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
Cho,C.R. ; Noh,K.Y. ; Lee,D.H. ; Kim,Y.S. ; Ko,S.W. ; Kim,C.W. ; Kim,D.H. ; Son,C.B. ; Kim,S.J. ; Cho,D.H. ; Choi,J.J. ; Kim,D.J. ; Bae,K.M. ; Rozgonyi,G.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.201-208,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
5.

Conference Proceedings
Conference Proceedings
5. Nature of D-Defeet in CZ Silicon:D-Defect Dissolution and D-Defect Related T.D.D.B
Park,J.-G. ; Jung,J.-K. ; Cho,K.-C. ; Rozgonyi,G.A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1697-1706,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201