1.

Conference Proceedings

Conference Proceedings
Wenus, J. ; Rutkowski, J. ; Rogalski,A.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.250-258,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
2.

Conference Proceedings

Conference Proceedings
Rogalski,A.
Pub. info.: 16th International conference on photoelectronics and night vision devices : 25-27 May 2000 Moscow, Russia.  pp.1-14,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4340
3.

Conference Proceedings

Conference Proceedings
Rogalski,A.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.307-322,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
4.

Conference Proceedings

Conference Proceedings
Rogalski,A.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.10-21,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
5.

Conference Proceedings

Conference Proceedings
Jozwikowski,K. ; Piotrowski,J. ; Adamiec,K. ; Rogalski,A.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.74-80,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629
6.

Conference Proceedings

Conference Proceedings
Rutkowski,J. ; Adamiec,K. ; Rogalski,A.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.327-335,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
7.

Conference Proceedings

Conference Proceedings
Rogalski,A. ; Razeghi,M.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.2-13,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
8.

Conference Proceedings

Conference Proceedings
Rogalski,A.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.260-269,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
9.

Conference Proceedings

Conference Proceedings
Rogalski,A.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.17-30,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
10.

Conference Proceedings

Conference Proceedings
Rogalski,A. ; Ciupa,R.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.328-337,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629