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39 results

Conference Proceedings

1. Absolute measurements of nonlinear absorption near LIDT at 193 nm

Blaschke,H. ; Ristau,D. ; Welsch,E. ; Apel,O.

Pub. info.:	Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado. pp.447-453, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4347

Conference Proceedings

2. Laser-induced damage investigation in chirped mirrors for ultrashort-pulse laser systems

Starke,K. ; GroB,T. ; Ristau,D.

Pub. info.:	Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado. pp.528-534, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4347

Conference Proceedings

3. Total scatter losses of optical components in the DUV/VUV spectral range

Kadkhoda,P. ; Mulller,A. ; Ristau,D.

Pub. info.:	Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado. pp.118-127, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3902

Conference Proceedings

4. Laser damage threshold of MgF2 thin films by photoacoustic beam deflection

Protopapa,M.L. ; Perrone,M.R. ; Piegari,A.M. ; Masetti,E. ; Ristau,D. ; Quesnel,E. ; Duparre,A.

Pub. info.:	Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado. pp.175-181, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3902

Conference Proceedings

5. Spectrophotometric characterization of gradient index coatings

Gunster,S. ; Dieckmann,M. ; Ristau,D. ; Bellac,D.Le

Pub. info.:	Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany. pp.529-538, 1999. Bellingham, WA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3738

Conference Proceedings

6. UV-optical and microstructural properties of MgF2 coatings deposited by IBS and PVD processes

Ristau,D. ; Arens,W. ; Bosch,S. ; Duparre,A. ; Masetti,E. ; Jacob,D. ; Kiriakidis,G. ; Peiro,F. ; Quesnel,E. ; Tikhonravov,A.V.

Pub. info.:	Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany. pp.436-445, 1999. Bellingham, WA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3738

Conference Proceedings

7. International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696

Kadkhoda,P. ; Amra,C. ; Bennett,J.M. ; Deumie,C. ; Duparre,A. ; Gliech,S. ; Jolie,C. ; Kessler,H. ; Lauth,H. ; Lindstroem,T. ; Muller,A. ; Reng,N. ; Ribbing,C.G. ; Ristau,D. ; Schuhmann,U. ; Tilsch,M.

Pub. info.:	Optical fabrication and testing : 26-28 May 1999, Berlin, Germany. pp.548-556, 1999. Bellingham, WA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3739

Conference Proceedings

8. Coated optics for DUV-excimer laser applications

Ullmann,J. ; Mertin,M. ; Lauth,H. ; Bernitzki,H. ; Mann,K. ; Ristau,D. ; Arens,W. ; Thielsch,R. ; Kaiser,N.

Pub. info.:	Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado. pp.514-527, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3902

Conference Proceedings

9. New procedure for the optical characterization of high-quality thin films

Bosch,S. ; Leinfellner,N. ; Quesnel,E. ; Duparre,A. ; Ferre-Borrull,J. ; Gunster,S. ; Ristau,D.

Pub. info.:	Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA. pp.124-130, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4099

10.

Conference Proceedings

10. Standardization in optics characterization

Ristau,D.

Pub. info.:	Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA. pp.91-109, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4099

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