1.

Conference Proceedings
Conference Proceedings
1. Nondestructive room-temperature characterization of wafer-sized ?-? semiconductor device structures using contactless electromodulation and surface photovoltage spectroscopy
Pollak,F.H.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part1  pp.408-422,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
2.

Conference Proceedings
Conference Proceedings
2. Contactless Evaluation of the Common-Emitter Current gain Factor in GaAlAs/GaAs HBTs from the Photovoltaic Effect Observed in Contactless Electroreflectance and Photoreflectance
Pollak,F.H. ; Gavrilenko,V.I. ; Krystek,W. ; Freeouf,J.L. ; Streit,D.C. ; Wojtowicz,M.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.255-266,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
3.

Conference Proceedings
Conference Proceedings
3. Room-temperature contactless electromodulation investigation of wafer-sized quantum well laser structures
Pollak,F.H. ; Krystek,W. ; Leibovitch,M. ; Malikova,L. ; Hybertsen,M.S. ; Lum,R. ; Vandenberg,J.M. ; ,C.L.Reynolds,Jr.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.455-466,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693
4.

Conference Proceedings
Conference Proceedings
4. Modeling of optical spectra for characterization of multiquantum-well InGaAsP-based lasers
Hybertsen,M.S. ; Baraff,G.A. ; Sputz,S.K. ; Ackerman,D.A. ; Shtengel,G.E. ; Vandenberg,J.M. ; Lum,R. ; ,C.L.Reynolds,Jr. ; Leibovitch,M. ; Pollak,F.H.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.430-441,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693