Capizzi, M. ; Polimeni, A. ; Hoghersthal, G. Baldassarri Hogher von ; Bissiri, M. ; Bonapasta, A. Amore ; Jiang, F. ; Stavola, M. ; Fischer, M. ; Forchel, A. ; Sou, I.K. ; Ge, W.K.
Pub. info.:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.251-256, 2002. Warrendale, Pa. Materials Research Society
Geddo, M. ; Guizzetti, G. ; Pezzuto, R. ; Polimeni, A. ; Capizzi, M. ; Bissiri, M. ; Baldassarri, G. ; Hogersthal, Hoger von ; Gollub, D. ; Forchel, A.
Pub. info.:
Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.531-536, 2003. Warrendale, Pa.. Materials Research Society
Buyanova, A. ; Chen, W.M. ; Tu, C.W. ; Polimeni, A. ; Capizzi, M.
Pub. info.:
State-of-the-art program on compound semiconductors XXXIX and nitride and wide bandgap semiconductors for sensors, photonics, and electronics IV : proceedings of the international symposia. pp.390-399, 2003. Pennington, N.J.. Electrochemical Society
Polimeni, A. ; Vinattieri, A. ; Zamfirescu, M. ; Masia, F. ; Capizzi, M.
Pub. info.:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX. pp.98-109, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering