1.

Conference Proceedings

Conference Proceedings
Pohl W. D.
Pub. info.: Forces in scanning probe methods.  pp.249-262,  1995.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 286
2.

Conference Proceedings

Conference Proceedings
Pohl W. D.
Pub. info.: Forces in scanning probe methods.  pp.235-248,  1995.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 286
3.

Conference Proceedings

Conference Proceedings
Pohl W. D.
Pub. info.: Near field optics.  pp.1-5,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 242
4.

Conference Proceedings

Conference Proceedings
Pohl W. D. ; Hecht B. ; Heinzelmann H.
Pub. info.: Nanoscale science and technology.  pp.175-183,  1998.  Boston.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 348
5.

Conference Proceedings

Conference Proceedings
Novotny L. ; Pohl W. D.
Pub. info.: Photons and local probes.  pp.21-33,  1995.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 300
6.

Conference Proceedings

Conference Proceedings
Hecht B. ; Pohl W. D. ; Heinzelmann H . ; Novony L.
Pub. info.: Photons and local probes.  pp.93-107,  1995.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 300
7.

Conference Proceedings

Conference Proceedings
Pohl W. D. ; Courjon D. ; Bainier C. ; Dereux A. ; Heinzelmann H.
Pub. info.: Near field optics.  pp.51-58,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 242
8.

Conference Proceedings

Conference Proceedings
Hecht B. ; Pohl W. D. ; Novotny L.
Pub. info.: Optics at the nanometer scale : imaging and storing with photonic near fields.  pp.151-161,  1996.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 319
9.

Conference Proceedings

Conference Proceedings
Pohl W. D.
Pub. info.: Point and extended defects in semiconductors.  pp.183-200,  1989.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 202