1.
|
Conference Proceedings
|
Pohl W. D.
Pub. info.: |
Forces in scanning probe methods. pp.249-262, 1995. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
286 |
|
2.
|
Conference Proceedings
|
Pohl W. D.
Pub. info.: |
Forces in scanning probe methods. pp.235-248, 1995. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
286 |
|
3.
|
Conference Proceedings
|
Pohl W. D.
Pub. info.: |
Near field optics. pp.1-5, 1993. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
242 |
|
4.
|
Conference Proceedings
|
Pohl W. D. ; Hecht B. ; Heinzelmann H.
Pub. info.: |
Nanoscale science and technology. pp.175-183, 1998. Boston. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
348 |
|
5.
|
Conference Proceedings
|
Novotny L. ; Pohl W. D.
Pub. info.: |
Photons and local probes. pp.21-33, 1995. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
300 |
|
6.
|
Conference Proceedings
|
Hecht B. ; Pohl W. D. ; Heinzelmann H . ; Novony L.
Pub. info.: |
Photons and local probes. pp.93-107, 1995. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
300 |
|
7.
|
Conference Proceedings
|
Pohl W. D. ; Courjon D. ; Bainier C. ; Dereux A. ; Heinzelmann H.
Pub. info.: |
Near field optics. pp.51-58, 1993. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
242 |
|
8.
|
Conference Proceedings
|
Hecht B. ; Pohl W. D. ; Novotny L.
Pub. info.: |
Optics at the nanometer scale : imaging and storing with photonic near fields. pp.151-161, 1996. Dordrecht. Kluwer Academic Publishers |
Title of ser.: |
NATO ASI series. Series E, Applied sciences |
Ser. no.: |
319 |
|
9.
|
Conference Proceedings
|
Pohl W. D.
Pub. info.: |
Point and extended defects in semiconductors. pp.183-200, 1989. New York. Plenum Press |
Title of ser.: |
NATO ASI series. Series B, Physics |
Ser. no.: |
202 |
|