1.

Conference Proceedings
Conference Proceedings
1. SPECTROSCOPIC ELLIPSOMETRY AS A NON-DESTRUCTIVE TECHNIQUE FOR CHARACTERIZATION OF ATOMIC-SCALE INTERFACES
Stehle, J.L. ; Piel, J.P. ; Lecat, J.H. ; Pickering, C. ; Hammond, L.C.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.459-464,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
2.

Conference Proceedings
Conference Proceedings
2. IN-SITU ELLIPSOMETRY AND LIGHT SCATTERING STUDIES OF SUBSTRATE CLEANING AND INITIAL LAYER DEPOSITION IN LOW TEMPERATURE CVD OF CRYSTALLINE sI
Pickering, C. ; Robbins, D. J. ; Young, I. M. ; Glasper, J. L. ; Johnson, M. ; Jones, R,.
Pub. info.: Initial stages of epitaxial growth : symposium held April 22-24, 1987, Anaheim, California, U.S.A..  pp.173-180,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 94
3.

Conference Proceedings
Conference Proceedings
3. REAL TIME OBSERVATION OF PERIODIC STEP ARRAYS DURING SILICON VAPOUR PHASE HOMOEPITAXY
Robbins, D. J. ; Young, I. M. ; Pidduck, A. J. ; Pickering, C. ; Glasper, J. L. ; Gasson, D. B.
Pub. info.: Initial stages of epitaxial growth : symposium held April 22-24, 1987, Anaheim, California, U.S.A..  pp.167-172,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 94
4.

Conference Proceedings
Conference Proceedings
4. IN-SITU DUAL-WAVELENGTH ELLIPSOMETRY AND LIGHT SCATTERING MONITORING OF Si/Si1-xGex HETEROSTRUCTURES AND MULTI-QUANTUM WELLS
Pickering, C. ; Hope, D. A. O. ; Leong, W. H. ; Robbins, D. J. ; Greef, R.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.53-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
5.

Conference Proceedings
Conference Proceedings
5. INTERPRETATION OF UV REFLECTANCE MEASUREMENTS ON SILICON-ON-SAPPHIRE BY SPECTRAL REFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY STUDIES
Pickering, C. ; Hodge, A.M. ; Daw, A.C. ; Robbins, D.J. ; Pearson, P.J. ; Greef, R.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.317-322,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
6.

Conference Proceedings
Conference Proceedings
6. SILICON OXIDATION BY RAPID THERMAL PROCESSING (RTP)
Hodge, A.M. ; Pickering, C. ; Pidduck, A.J. ; Hardeman, R.W.
Pub. info.: Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.313-320,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 52