1.

Conference Proceedings
Conference Proceedings
1. Evaluation of carbon surface diffusion on silicon by using surface phase transitions
Scharmann,F. ; Maslarski,P. ; Lehmkuhl,D. ; Stauden,Th. ; Pezoldt,J.
Pub. info.: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.  pp.173-177,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4348
2.

Conference Proceedings
Conference Proceedings
2. Theoretical and experimental studies of(AIN)1-x(SIC)x layer structures formed by N + and AI + coimplantation in 6H-SiC
Kulikov,D.V. ; Pezoldt,J. ; Rybin,P.V. ; Skorupa,W. ; Trushin,Yu.V. ; Yankov,R.A.
Pub. info.: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.254-257,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3687
3.

Conference Proceedings
Conference Proceedings
3. Computer simulation and RBS/C studies of high-dose N+ and Al- co-implantation in 6H-SiC
Kharlamov,V.S. ; Kulikov,D.V. ; Trushin,Yu.V. ; Tsigankov,D.N. ; Yankov,R.A. ; Voelskow,M. ; Skorupa,W. ; Pezoldt,J.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.260-263,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
4.

Conference Proceedings
Conference Proceedings
4. Auger depth profiling of thin SiC layers:practical aspects for a better understanding of quantitative analysis
Pieterwas,R. ; Kosiba,R. ; Ecke,G. ; Pezoldt,J. ; RoBler,H.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.281-287,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
5.

Conference Proceedings
Conference Proceedings
5. Photothermal measurements of Al+-and Al+/N+-implanted 6H-SiC
Pezoldt,J. ; Teichert,G. ; Panknin,D. ; Voelskow,M.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.276-280,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
6.

Conference Proceedings
Conference Proceedings
6. The Measurement of the Thickness of Thin SiC Layers on Silicon
Cimalla,V. ; Scheiner,J. ; Ecke,G. ; Friedrich,M. ; Goldhahn,R. ; Zahn,D.R.T. ; Pezoldt,J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.641-644,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
7.

Conference Proceedings
Conference Proceedings
7. Ion Beam Synthesis:A Novel Method of Producing(SiC)1-x(AlN)x Layers
Yankov,R.A. ; Fukarek,W. ; Voelskow,M. ; Pezoldt,J. ; Skorupa,W.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.753-756,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
8.

Conference Proceedings
Conference Proceedings
8. Cross-Sectional Micro-Raman Spectroscopy:A Tool for Structural Investigations of Thin Polytypic SiC Layers
Werninghaus,T. ; Zahn,D.R.T. ; Yankov,R.A. ; Mucklich,A. ; Pezoldt,J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.661-664,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
9.

Conference Proceedings
Conference Proceedings
9. A Computational Model for the Formation of(SiC)1-x(AlN)x Structures by Hot,High-Dose N+ and Al+ Co-Implants in 6H-SiC
Truschin,Yu.V. ; Yankov,R.A. ; Kharlamov,V.S. ; Kulikov,D.V. ; Tsigankov,D.N. ; Kreissig,U. ; Voelskow,M. ; Pezoldt,J. ; Skorupa,W.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.757-760,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
10.

Conference Proceedings
Conference Proceedings
10. Growth of SiC Layers on(111)Si by Solid Source Molecular Beam Epitaxy
Pezoldt,J. ; Stauden,T. ; Cimalla,V. ; Ecke,G. ; Romanus,H. ; Eichhorn,G.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.251-254,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268