1.
Conference Proceedings
Pendse,D.R. ; Chin,A.K. ; Bull,D. ; Maider,J.
Pub. info.:
Testing, Reliability, and Applications of Optoelectronic Devices . pp.1-13, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4285
2.
Conference Proceedings
Dabkowski,F.P. ; Pendse,D.R. ; Barrett,R.J. ; Chin,A.K. ; Jollay,R. ; Clausen,E.M. ; Hughes,Jr.,L.C. ; Sanders,N.B.
Pub. info.:
Semiconductor Lasers II . pp.36-49, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2886
3.
Conference Proceedings
Hu,C. ; Mahajan,S. ; Dabkowski,F.P. ; Pendse,D.R. ; Barrett,R.J. ; Chin,A.K.
Pub. info.:
Semiconductor Lasers II . pp.59-66, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2886
4.
Conference Proceedings
Pendse,D.R. ; Chin,A.K. ; Dabkowski,F.P. ; Clausen,E.M.
Pub. info.:
Semiconductor Lasers III . pp.79-85, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3547