1.

Conference Proceedings
Conference Proceedings
1. SELECTIVE METALLIZATION OF DIAMOND FILMS
Pehrsson, P.E. ; Calvert, J.M. ; Peckerar, M.C. ; Dulcey, C.S.
Pub. info.: Proceedings of the Third International Symposium on Diamond Materials.  pp.598-604,  1993.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-17
2.

Conference Proceedings
Conference Proceedings
2. Nanoscience: a new thrust for science in the 21st century?
Peckerar, M.C.
Pub. info.: Nanostructure Science, Metrology, and Technology.  pp.1-18,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4608
3.

Conference Proceedings
Conference Proceedings
3. Nanostructures and biology: some introductory remarks
Postek, M.T., Jr. ; Peckerar, M.C.
Pub. info.: Nanostructure Science, Metrology, and Technology.  pp.229-229,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4608
4.

Conference Proceedings
Conference Proceedings
4. Sensing macromolecules with microelectronics
Perkins, F.K. ; Tender, L.M. ; Fertig, S.J. ; Peckerar, M.C.
Pub. info.: Nanostructure Science, Metrology, and Technology.  pp.251-265,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4608
5.

Conference Proceedings
Conference Proceedings
5. Toward a retinal prosthesis for the blind: advanced microelectronics combined with a nanochannel glass electrode array
Scribner, D.A. ; Humayun, M.S. ; Justus B.L. ; Merritt, C.D. ; Klein. R.B. ; Howard, J.G. ; Peckerar, M.C. ; Perkins, F.K. ; Johnson, LJ. ; Bassett, W. ; Skeath, P. ; Weiland, J. ; de Juan, E., Jr. ; Finch, J. A. ; Graham, R.W. ; Trautfield, W.C. ; Taylor, S. M.
Pub. info.: Nanostructure Science, Metrology, and Technology.  pp.239-244,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4608