1.

Conference Proceedings
Conference Proceedings
1. Silicon Defect characterization by High Resolution Laplace Deep Level Transient Spectroscopy*
Peaker, A.R. ; Dobaczewski, L. ; Andersen, O. ; Rubaldo, L. ; Hawkins, I.D. ; Bonde Nielsen, K. ; Evans-Freeman, J.H.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.549-560,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. Self-Assembled 3-Dimensional Arrays of In P Quantum Wires: Impact of The Template Geometry Upon The Optical, Properties
Romanov, S.G. ; Johnson, N.P. ; Sotomayor Torres, C.M. ; Yates, H.M. ; Agger, J. ; Pemble, M.E. ; Anderson, M.W. ; Peaker, A.R. ; Butko, V.
Pub. info.: Proceedings of the Third International Symposium on Quantum Confinement: Physics and Applications.  pp.14-30,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-17
3.

Conference Proceedings
Conference Proceedings
3. ELECTRICAL AND OPTICAL PROPERTIES OF ERBIUM IN MBE SILICON AND Si/Ge ALLOYS
Efeoglu, H. ; Evans, J.H. ; Langer, J.M. ; Peaker, A.R. ; Rowell, N.L. ; Noel, J.-P. ; Perovic, D.D. ; Jackman, T.E. ; Houghton, D.C.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.367-372,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
4.

Conference Proceedings
Conference Proceedings
4. Light emission in silicon-germanium at 1.54 ｦﾌm using erbium luminescence
Huda, M.Q. ; Peaker, A.R.
Pub. info.: Millimeter and Submillimeter Waves IV : 20-23 July 1998, San Diego, California.  pp.357-362,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3465
5.

Conference Proceedings
Conference Proceedings
5. Hydrogen Contamination and Defect Generation in p-type Silicon and Silicon-Germanium Schottky Barrier Test Structures
Volpi, F. ; Peaker, A.R. ; Berbezier, I. ; Ronda, A.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.88-95,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
6.

Conference Proceedings
Conference Proceedings
6. Novel Characterization Techniques for Interface Related Defects in Semiconductor-Insulator Systems
Hamilton, B. ; Ishii, M. ; Peaker, A.R.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.47-58,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
7.

Conference Proceedings
Conference Proceedings
7. High resolution Laplace deep level transient spectroscopy a new tool to study implant damage in silieon
Peaker, A.R. ; Evans-Freemann, J.-H. ; Dobaczewski, L. ; Markevich, V. ; Andersen, O. ; Rubaldo, L. ; Kan, P.Y.Y. ; Hawkins, I.D. ; Goecinski, K. ; Nielsen, K.Bonde
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.166-178,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29
8.

Conference Proceedings
Conference Proceedings
8. Hydrogen Contamination and Defect Generation in p-type Silicon and Silicon-Germanium Schottky Barrier Test Structures
Volpi, F. ; Peaker, A.R. ; Berbezier, I. ; Ronda, A.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.88-95,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3