Rumyantsev, S. L. ; Shur, M. S. ; Knap, W. ; Dyakonova, N. ; Pascal, F. ; Hoffman, A. ; Ghuel, Y. ; Gaquiere, C. ; Theron, D.
Pub. info.:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.277-285, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Benoit, P. ; Chay, C. ; Delseny, C. ; Pascal, F. ; Llinares, P. ; Vildeuil, J.-C. ; Baudry, H.
Pub. info.:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.242-250, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering