1.

Conference Proceedings

Conference Proceedings
Kim,H.S. ; Park,C.H. ; Shin,Y.T. ; Jung,J.Y.
Pub. info.: Process control and sensors for manufacturing : 31 March - 1 April 1998, San Antonio, Texas.  pp.57-63,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3399
2.

Conference Proceedings

Conference Proceedings
Chadi,D.J. ; Park,C.H.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.285-292,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201