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Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.. pp.545-550, 1989. Pittsburgh, Pa.. Materials Research Society
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Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1021-1024, 2002. Zuerich, Switzerland. Trans Tech Publications
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Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1021-1024, 2002. Zuerich, Switzerland. Trans Tech Publications
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Liquid Crystal Materials, Devices, and Applications X and Projection Displays X. pp.188-197, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering