1.

Conference Proceedings
Conference Proceedings
1. Minority Carrier Lifetime and Impurity Level Scan Map in Silicon
Palais, O. ; Yakimov, E. ; Simon, J.J. ; Martinuzzi, S.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.396-402,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. Iron concentration mapping in monocrystalline silicon wafers
Palais, O. ; Simon, J.J. ; Yakimov, E. ; Martinuzzi, S.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.233-240,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29
3.

Conference Proceedings
Conference Proceedings
3. Gettering and Lifetime Engineering in Silicon Wafers*
Martinuzzi, S. ; Palais, O.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.233-248,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20