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12 results

Conference Proceedings

1. RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability

Dell,J.M. ; Antoszewski,J. ; White,J.K. ; Pal,R. ; Nguyen,T. ; Musca,C.A. ; Faraone,L.

Pub. info.:	Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA. pp.106-115, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4454

Conference Proceedings

2. Growth and Characterization of Single and Strained Multi-layer Structures of Ga0.89In0.11As/GaAs Layers

Pal,R. ; Singh,M. ; Agarwal,S.K. ; Bose,D,N.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.349-351, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

3. Etch Pit Observation of Ga1-xInxAs Epitaxial Layers Grown on GaAs and InP Substrates

Pal,R. ; Radhakrishnan,J.K. ; Agarwal,S.K. ; Bose,D.N.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.345-348, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

4. Surface Characterisation of n-HgCdTe by Analysis of Magnetic Field Dependent Hall Data

Pal,R. ; Sharma,B.L. ; Durai,L. ; Gopal,V. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.814-817, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

5. Characterisation of Metalorganic Chemical Vapour Deposited CdTe Films on Sapphire for HgCdTe Passivation

Pal,R. ; Bhatt,M. ; Narang,V. ; Singh,R.A. ; Dube,G.C. ; Kumar,V.

Pub. info.:	Physics of - Semiconductor Devices -. Part 2 pp.810-813, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

6. Growth of GaAs/Ge Solar Cell by MOVPE

Tyagi,R. ; Pal,R. ; Singh,M. ; Bal,M. ; Haldar,T. ; Agarwal,S.K.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.457-459, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

7. Multijunction GaAs Solar Cell without the Tunnel Junction

Singh,S.N. ; Pal,R. ; Singh,M. ; Bal,M. ; Haldar,T. ; Agarwal,S.K.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.454-456, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

8. Traps in the Passivant-HgCdTe Interface Region

Pal,R. ; Gopal,V. ; Chaudhary,P.K. ; Sharma,B.L. ; Basu,P.K. ; Agnilotri,O.P. ; Kumar,V.

Pub. info.:	Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.26-34, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3975

Conference Proceedings

9. Hg1-xCdxTe LWIR Photoconductive Linear Array Detector Fabrication Process Control Through Lifetime Monitoring

Sharma,B.L. ; Arora,P.K.Bedi S.C. ; Shreeniwas ; Chaudhary,P.K. ; Pal,R. ; Gupta,A.K. ; Singh,R. ; Basu,P.K. ; Gopal,V.

Pub. info.:	Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.97-100, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3975

10.

Conference Proceedings

10. Growth of Si1-xGex/Si Heterostructures by RPCVD and their Characterization

Arora,R.S. ; Venkateswaran,R. ; Pal,R. ; Datta,P. ; Kesavan,R. ; Maiti,Chinmay K.

Pub. info.:	Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.337-340, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3975

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Author: Pal,R.