1.

Conference Proceedings
Conference Proceedings
1. Optimally curved electrodes for a rotary microactuator
Jung,S. ; Jeon,J.U. ; Pak,Y.E. ; Lee,S.
Pub. info.: Smart structures and materials 2000 : smart electronics and MEMS : 6-8 March, 2000, Newport Beach, USA.  pp.178-184,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3990
2.

Conference Proceedings
Conference Proceedings
2. MEMS and nanotechnology research for the electronics industry
Pak,Y.E.
Pub. info.: Smart structures and materials 2001 : smart electronics and MEMS : 5-7 March, 2001, Newport Beach, USA.  pp.23-29,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4334
3.

Conference Proceedings
Conference Proceedings
3. Five-port equivalent electric circuit of piezoelectric bimorph beam
Cho,Y.S. ; Pak,Y.E. ; jeong,H.M. ; Ha,S.K.
Pub. info.: Smart structures and materials 1999 : smart electronics and MEMS : 1-3 March, 1999, Newport Beach, California.  pp.261-277,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3673
4.

Conference Proceedings
Conference Proceedings
4. Formation and observation of ferroelectric domains in PbZr1-xTixO3(PZT)thin films using atomic force microscopy
Shin,H. ; Lee,K. ; Lim,G. ; Jeon,J.U. ; Pak,Y.E. ; Hong,S. ; No,K.
Pub. info.: Smart structures and materials 1999 : Smart materials technologies : 3-4 March 1999, Newport Beach, California.  pp.94-102,  1999.  Bellingham.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3675
5.

Conference Proceedings
Conference Proceedings
5. Diagnosis of microcrack initiation and estimation frac-ture toughness for micromachined silicon comb device with prenotch actuated by electrostatic force
Lee,S.-H. ; Kim,J.S. ; Pak,Y.E. ; Jeon,J.-U. ; Kwon,D.
Pub. info.: MEMS Reliability for Critical Applications.  pp.133-144,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4180