1.

Conference Proceedings
Conference Proceedings
1. INVITED: INTEGRATED METROLOGY AND ADVANCED PROCESS CONTROL IN SEMICONDUCTOR MANUFACTURING
Shanmugasundram, A.P. ; Sarfaty, M. ; Schwann, A. ; Paik, J.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.850-862,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
2.

Conference Proceedings
Conference Proceedings
2. Dynamic region-of-interest acquisition and face tracking for intelligent surveillance system
Kim, Y.-O. ; Kim, S. ; Park, C.-W. ; Sung, H.-G. ; Paik, J.
Pub. info.: Computational imaging II : 19-20 January 2004, San Jose, California, USA.  pp.369-377,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5299
3.

Conference Proceedings
Conference Proceedings
3. Performance analysis of color spaces for optimally fitting the active shape model
Kim, S. ; Kang, J. ; Shin, J. ; Paik, J.
Pub. info.: Computational imaging II : 19-20 January 2004, San Jose, California, USA.  pp.345-356,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5299
4.

Conference Proceedings
Conference Proceedings
4. INVITED: INTEGRATED METROLOGY AND ADVANCED PROCESS CONTROL IN SEMICONDUCTOR MANUFACTURING
Shanmugasundram, A.P. ; Sarfaty, M. ; Schwann, A. ; Paik, J.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.850-862,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
5.

Technical Paper
Technical Paper
5. Cross-Sectional Sizing and Optimization of Composite Blades
Hodges, D. ; Volovoi, V. ; Paik, J.
Pub. info.: A collection of technical papers : 43rd AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference : 10th AIAA/ASME/AHS Adaptive Structures Forum : 4th AIAA Non-Deterministic Approaches Forum : 3rd AIAA Gossamer Spacecraft Forum, Denver, Colorado, 22-25 April 2002.  v. 2  pp.953-957,  2002.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 2002
6.

Conference Proceedings
Conference Proceedings
6. Auto calibration for multiple camera-based surveillance system [5960-145]
Kwon, O. ; Kim, S. ; Shin, J. ; Paik, J.
Pub. info.: Visual Communications and Image Processing 2005.  pp.1371-1380,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5960
7.

Conference Proceedings
Conference Proceedings
7. Real-time video tracking using PTZ cameras
Kang, S. ; Paik, J. ; Koschan, A. ; Abidi, B.R. ; Abidi, M.A. ; Weiss, M. ; Schiller, A. ; O'Leary, P. ; Fauster, E. ; Schalk, P.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.103-111,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
8.

Conference Proceedings
Conference Proceedings
8. Face recognition: evaluation report for FaceIt identification and surveillance
Heo, J. ; Abidi, B.R. ; Paik, J. ; Abidi, M.A.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.551-558,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
9.

Conference Proceedings
Conference Proceedings
9. Visualization of volumetric scattered data by using weighted alpha shapes [6066-25]
Paik, J. ; Lee, K. ; Yu, K. ; Gwun, O.
Pub. info.: Vision Geometry XIV.  pp.60660N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6066
10.

Conference Proceedings
Conference Proceedings
10. Real-time digital autofocusing using a priori estimated set of PSFs
Hwang, S. ; Kim, K. ; Shin, J. ; Paik, J. ; Abidi, B. ; Abidi, M.
Pub. info.: Real-Time Imaging VIII.  pp.66-77,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5297