1.

Conference Proceedings
Conference Proceedings
1. Polarized monochromatic x-ray beam extracted from laboratory electron impact source
Koike,T. ; Hayashida,K. ; Hashimoto,Y. ; Akutsu,D. ; Ohtani,M. ; Tsunemi,H.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.414-421,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
2.

Conference Proceedings
Conference Proceedings
2. Convergent-beam parallel detection x-ray diffraction system for characterizing combinatorial epitaxial thin films
Omote,K. ; Kikuchi,T. ; Harada,J. ; Kawasaki,M. ; Ohtomo,A. ; Ohtani,M. ; Ohnishi,T. ; Komiyama,D. ; Koinuma,H.
Pub. info.: Combinatorial and composition spread techniques in materials and device development : 26 January 2000, San Jose, California.  pp.84-91,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3941
3.

Conference Proceedings
Conference Proceedings
3. Quantum efficiency measurement of the x-ray CCD camera(XIS)for the｡ｦe ASTRO-E mission in the soft-x-ray band
Kohmura,T. ; Katayama,K. ; Katayama,H. ; Shouho,M. ; Tsunemi,H. ; Kitamoto,S. ; Hayashida,K. ; Miyata,E. ; Ohtani,M. ; Ohta,M. ; Yoshita,K. ; Koyama,K. ; Ricker,G.R.,Jr. ; Bautz,M.W. ; Kissel,S.E.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.588-596,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
4.

Conference Proceedings
Conference Proceedings
4. Development of fast and flexible data acquisition system for CCDs:Osaka University CCD controller system
Akutsu,D. ; Natsukari,C. ; Miyata,E. ; Ohtani,M. ; Nomachi,M. ; Ozaki,M.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.394-401,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings
Conference Proceedings
5. Performance and calibration of the x-ray CCD camera of the MAXI experiment on the ISS/JEM
Miyata,E. ; Natsukari,C. ; Akutsu,D. ; Ohtani,M. ; Tsunemi,H. ; Matsuoka,M. ; Kawai,N.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.186-193,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
6.

Conference Proceedings
Conference Proceedings
6. Temperture-gradient and composition-spread deposition of epitaxial oxide films and high-throughput characterization
Fukumura,T. ; Ohtani,M. ; Nishimura,J. ; Kageyama,T. ; Koida,T. ; Lippmaa,M. ; Kawasaki,M. ; Hasegawa,T. ; Koinuma,H.
Pub. info.: Combinatorial and composition spread techniques in materials and device development II : 22-23, 25 January, 2001, San Jose, USA.  pp.17-26,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4281