1.

Conference Proceedings
Conference Proceedings
1. The Characterization on Process Induced Damage of Silicon Wafering Process - Mechanical Damage
Oh, H.S. ; Kim, J.R. ; Kim, T.H. ; Yu, J.J. ; Lee, H.L. ; Lee, J.H. ; Rice, D.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.100-108,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
2.

Conference Proceedings
Conference Proceedings
2. The Use of Dispersive Double Crystal Monochromator ? A Way for High-Resolution Powder Diffractometry
Mikula, P. ; Vrana, M. ; Choi, Y.N. ; Kim, S.A. ; Oh, H.S. ; Sung, K.H. ; Lee, C.H.
Pub. info.: ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002.  pp.299-302,  2002.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 404-407