1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF A RAPID THERMAL ANNEALED TiNXOY /TiSi2 BARRIER LAYER
Chittipeddi, Sailesh ; Kelly, Michael J. ; Dziuba, Chales M. ; Oates, Anthony S. ; Cochran, William T.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.527-530,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
2.

Conference Proceedings
Conference Proceedings
2. A Comparison of Electromigration in Bulk and Thin-Film Aluminum
Oates, Anthony S.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.277-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391