1.

Conference Proceedings
Conference Proceedings
1. Discolored bondpads caused by aluminum hydroxide formation
Wu,Z.M. ; Oh,C.K. ; Neo,S.P. ; Redkar,S.
Pub. info.: Process Control and Diagnostics.  pp.259-266,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4182
2.

Conference Proceedings
Conference Proceedings
2. Failure analysis of wafer-level reliability testing failure
Oh,C.K. ; Neo,S.P. ; Bi,J.H. ; Wu,Z.M. ; Goh,L.C. ; Redkar,S.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.228-235,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884